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| 528 | =================== |
528 | =================== |
| 529 | = 8. Change log === |
529 | = 8. Change log === |
| 530 | =================== |
530 | =================== |
| 531 | 531 | ||
| 532 |
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532 | 11.8.2016 (Current Rev): |
| - | 533 | a) When using breakdown voltage or relative PDE analysis and with only one file selected, the analysis is stopped and the fit |
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| - | 534 | is displayed on the graph. This makes it easier to setup fitting settings. |
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| - | 535 | b) Added the possibility to export plots created through analysis ("Start and edit" option). |
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| - | 536 | c) Everytime, when opening a histogram file, the following open and save dialog windows automatically open up in that directory. |
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| - | 537 | This makes it easier to find the directory that was used last. |
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| - | 538 | d) Added a dropdown list to the Analysis tab, so that it is possible to set position units for plots (table units or microns). |
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| - | 539 | e) Normalization to a maximum of 1 now works for surface scans. |
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| - | 540 | ||
| - | 541 | 4.4.2016 (Rev 146): |
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| 533 | a) Complete restructure of the program, so that it now runs seperately, not through ROOT (libraries are constructed pre-run). |
542 | a) Complete restructure of the program, so that it now runs seperately, not through ROOT (libraries are constructed pre-run). |
| 534 | Program is now split into multiple tabs for easier use, three of which are Measurement, Analysis and Help. |
543 | Program is now split into multiple tabs for easier use, three of which are Measurement, Analysis and Help. |
| 535 | b) Added support for relative PDE measurements with included sample rotation table. |
544 | b) Added support for relative PDE measurements with included sample rotation table. |
| 536 | c) Improvement of analysis part of the program (includes ADC spectrum integration, breakdown voltage characterization, surface |
545 | c) Improvement of analysis part of the program (includes ADC spectrum integration, breakdown voltage characterization, surface |
| 537 | scans, relative PDE characterization,...). |
546 | scans, relative PDE characterization,...). |