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Ignore whitespace Rev 146 → Rev 167

/lab/sipmscan/trunk/doc/README
529,7 → 529,16
= 8. Change log ===
===================
 
4.4.2016 (Current Rev):
11.8.2016 (Current Rev):
a) When using breakdown voltage or relative PDE analysis and with only one file selected, the analysis is stopped and the fit
is displayed on the graph. This makes it easier to setup fitting settings.
b) Added the possibility to export plots created through analysis ("Start and edit" option).
c) Everytime, when opening a histogram file, the following open and save dialog windows automatically open up in that directory.
This makes it easier to find the directory that was used last.
d) Added a dropdown list to the Analysis tab, so that it is possible to set position units for plots (table units or microns).
e) Normalization to a maximum of 1 now works for surface scans.
 
4.4.2016 (Rev 146):
a) Complete restructure of the program, so that it now runs seperately, not through ROOT (libraries are constructed pre-run).
Program is now split into multiple tabs for easier use, three of which are Measurement, Analysis and Help.
b) Added support for relative PDE measurements with included sample rotation table.
/lab/sipmscan/trunk/doc/documentation.html
511,8 → 511,17
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<h2 id="changelog">8. Change log</h2>
<p>4.4.2016 (Current Rev):</p>
<p>11.8.2016 (Current Rev):</p>
<ol type="a">
<li>When using breakdown voltage or relative PDE analysis and with only one file selected, the analysis is stopped and the fit is displayed on the graph. This makes it easier to setup fitting settings.</li>
<li>Added the possibility to export plots created through analysis ("Start and edit" option).</li>
<li>Everytime, when opening a histogram file, the following open and save dialog windows automatically open up in that directory. This makes it easier to find the directory that was used last.</li>
<li>Added a dropdown list to the Analysis tab, so that it is possible to set position units for plots (table units or microns).</li>
<li>Normalization to a maximum of 1 now works for surface scans.</li>
</ol><br/>
 
<p>4.4.2016 (Rev 146):</p>
<ol type="a">
<li>Complete restructure of the program, so that it now runs seperately, not through ROOT (libraries are constructed pre-run). Program is now split into multiple tabs for easier use, three of which are Measurement, Analysis and Help.</li>
<li>Added support for relative PDE measurements with included sample rotation table.</li>
<li>Improvement of analysis part of the program (includes ADC spectrum integration, breakdown voltage characterization, surface scans, relative PDE characterization,...).</li>