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SOFTWARE FOR SIPM CHARACTERIZATION WITH CAMAC, SCOPE, BIAS VOLTAGE AND TABLE POSITION SUPPORT
2
=============================================================================================
3
By Gasper Kukec Mezek, April 2015.
4
 
5
==============
6
= Contents ===
7
==============
8
 
9
  1.  Installation
10
  2.  Running the software
11
  3.  Program feature overview
12
  3a. Current program version (trunk)
13
  3b. Old program version (trunk_v0.9)
14
  4.  Preparing for measurements
15
  4a. Pre-software checks
16
  4b. Experimental setup pre-measurement checks
17
  4c. Software pre-measurement checks
18
  5.  Measurements
19
  5a. Measurement settings
20
  5b. Temperature chamber considerations
21
  5c. Movement table
22
  5d. Bias voltage supply
23
  6.  Measurement files
24
  6a. ROOT file structure
25
  6b. Opening measurement files
26
  7.  Analysis
27
  8.  Change log
28
 
29
=====================
30
= 1. Installation ===
31
=====================
32
 
33
See $sipmscan/doc/INSTALL for installation instructions or use "./configure help".
34
 
35
=============================
36
= 2. Running the software ===
37
=============================
38
 
39
Once installation is performed, use
40
   ./start.sh
41
to start the software in offline mode or
42
   sudo ./start.sh
43
to start the software in online mode. Once the software starts, it will let you know (in the terminal) if connection to CAMAC
44
was correctly established.
45
 
46
=================================
47
= 3. Program feature overview ===
48
=================================
49
 
50
This part describes the different parts of the software and a short description on what they do.
51
____________________________________
52
3a. Current program version (trunk):
53
 
54
The main window is divided into 4 tabs and then further into subwindows:
55
1) Measurement tab:
56
   a) Settings pane:
57
      - ON/OFF switches for voltage, surface, Z axis and rotation scans (ON when checked).
58
      - A voltage limiter -> Sets the maximum output voltage that can be set under Output voltage (sample safety reasons).
59
      - Nr. of channels -> The number of channels to measure. Each channel corresponds to an ADC/TDC pair.
60
      - Position units -> For display, use either movement table native units or micrometers (table units default).
61
      - Rotation units -> For display, use either rotation table native units or degrees (degrees default).
62
      - Scope IP -> Sets the oscilloscope IP address for connections to a device.
63
      - LASER settings info panel -> Additional information to be written to the output file header (most generally used for
64
        laser information).
65
      - Chamber temperature -> Chamber temperature to be written to the output file (temperature not directly taken from the
66
        fieldpoint sensor).
67
      - Live histogram ON/OFF -> ON/OFF switch for live histogram update. Offers quick overview of the current measurement.
68
        Should be avoided for scans.
69
   b) Display: Display of the live histogram, when it is turned on.
70
   c) Main measurement window:
71
      - Settings for bias voltage, table position and incidence angle measurements.
72
      - Additional settings enabled, when scans are enabled.
73
      - If only one directional scan in X or Y direction is needed, set measurement to a surface scan and leave the other
74
      step size to 0.
75
      - Number of events -> Number of events gathered in one measurement.
76
      - Time stamp -> Date and time of measurement that is written to the header of the output file.
77
      - Save to file -> Selecting of output file filename. For scans, sequential numbers are appended to the end of the
78
      selected filename (i.e. /path/to/test.root will in a scan have /path/to/test_001.root, /path/to/test_002.root,...).
79
      - Start acquisition -> Starts the measurement based on currently selected settings.
80
      - Current measurement progress bar -> Determines the status of the current measurement.
81
 
82
2) Analysis tab:
83
   a) Histogram file selection:
84
      - Open past measurements for analysis. Additional display of header information for quicker reference.
85
      - If using multiple files for the analysis, use multiple file select or select all listed files. They will be used in
86
      order displayed on the list.
87
      - Use the Clear list button to clear all entries in from the list.
88
      - Use the edit header button to update any information inside the headers of entries selected on the list.
89
   b) Histogram: Displays the currently selected histogram from the histogram file selection subwindow.
90
   c) Histogram controls:
91
      - Enables plotting options for the currently selected histogram and to setup spectral options for analysis.
92
      - ADC range -> Sets the range of the ADC spectrum. Ranges are automatic, when set to (0,0).
93
      - TDC range -> Sets the range of the TDC spectrum. TDC spectrum determines the events used for plotting the ADC spectrum.
94
      - Y range -> Sets the range of the Y axis on the spectrum. Ranges are automatic, when set to (0,0). 
95
      - Display channel -> Selects the channel to plot, when opening a multichannel measurement file.
96
      - Plot type buttons -> Buttons to change between ADC, TDC or ADC/TDC type of plot.
97
      - Logarithmic scale ON/OFF -> Toggle for logarithmic Y axis scale.
98
      - Clean plots ON/OFF -> Toggle for hiding plot information or not (such as plot title, fitting information, statistics
99
      information).
100
      - Export -> Exports the currently selected histograms (ADC, TDC or ADC/TDC form selected files) into the .pdf format.
101
      - Edit -> UNDER DEVELOPMENT! Opens the currently visible plot in the Histogram subwindow in a new tab to enable editing.
102
   d) Analysis:
103
      - Options for specific analysis types (integrate spectrum, relative PDE, breakdown voltage, surface scan, timing). When
104
      using Start button, analysis starts, saves results and quits. When using Start and edit button, analysis starts and gives
105
      options to further edit the results.
106
      - General fit settings (Peak sigma, S/N ratio, background interpolation, ADC spectrum offset, Maximum acceptable peak
107
      fit error, pedestal lower limit, background subtraction, export fits). Settings for analysis based on fitting of peaks
108
      on the ADC spectra (breakdown voltage and relative PDE). The current progress of the analysis is displayed on the
109
      progress bar.
110
 
111
3) Monitoring tab: UNDER DEVELOPMENT! Fieldpoint temperature sensor data view.
112
 
113
4) Help tab: Displays the contents of this help file.
114
 
115
On the top, there are 3 menus:
116
a) File:
117
   - Set user layout -> Set a user saved layout of the program subwindows or use the default.
118
   - Save current layout -> Save the program subwindow layout to be used later. This will remember the sizes of each subwindow
119
   (Settings pane, Main measurement window, Display, Histogram file selection,...) and the overall size of the program window.
120
   - Save current measurement settings -> UNDER DEVELOPMENT! Will evantually save the entered values from the Measurement tab.
121
   - Save current analysis settings -> UNDER DEVELOPMENT! Will eventually save the entered values from the Analysis tab.
122
   - Exit -> Exit the software (shortkey x)
123
 
124
b) Analysis (each takes you to the appropriate options for the analysis):
125
   - Histogram type -> Change between histogram types (same as in histogram controls window).
126
   - Fit spectrum -> UNDER DEVELOPMENT! Will produce a fit of ADC spectrum peak structure of the current file/files.
127
   - Integrate spectrum -> Integrate the ADC spectrum of the current file/files inside the selected ADC range.
128
   - Integrate spectrum (X direction) -> Same as Integrate spectrum, but the selected files were produced as X axis scans.
129
   Makes the determination of an X directional edge scan and produces a 2D plot if Z axis scan was also enabled.
130
   - Integrate spectrum (Y direction) -> Same as Integrate spectrum (X direction), but the selected files were produced as
131
   Y axis scans.
132
   - Relative PDE -> Produce a relative PDE plot, where selected files were produced as incidence angle scans.
133
   - Surface 2D scan -> Produce an integral of the ADC spectrum, where selected files were produced as surface scans (in
134
   X and Y directions).
135
   - Timing analysis -> UNDER DEVELOPMENT! Will make an analysis on the TDC spectrum of measurements.
136
 
137
c) Help information
138
 
139
Important!
140
When using any analysis method, only events inside the selected TDC window will be used (set the TDC range accordingly).
141
 
142
_____________________________________
143
3b. Old program version (trunk_v0.9):
144
 
145
The main window is divided into 5 subwindows:
146
a) Settings window:
147
   - ON/OFF switches for voltage and surface scans.
148
   - a voltage limiter -> sets the maximum output voltage for safety reasons
149
   - clean plots toggle switch -> when ON, no additional stats will be displayed on plots/histograms
150
   - scope IP -> sets the oscilloscope IP address
151
   - LASER settings info panel -> this will be written to the output file and is used for supplying additional information
152
   - chamber temperature -> the chamber temperature to be written to the output file
153
   - incidence angle -> the angle at which the sample is rotated around its axis, relative to the LASER beam (0 degrees is
154
   perpendicular to LASER beam)
155
 
156
b) Main measurement window:
157
   - settings for table position and bias voltage
158
   - when scans are enabled, additional settings for scans
159
   - number of events -> setting for the number of events to gather in a measurement
160
   - time stamp -> informational time (start time of measurement is written to output file)
161
   - file selector (for scans, the filenames will be appended sequential numbers to distinguish them)
162
   - start acquisition button -> starts the measurement based on selected settings
163
   - waveform analysis settings (channel, measurement type)
164
   - possibility to send custom one-line commands
165
 
166
c) Histogram file selection window:
167
   - open past measurements for analysis
168
   - if using multiple files, use multiple file select or select all listed files
169
   - files will be used in order displayed on the list
170
   - to clear the complete list, use the clear list button
171
   - to edit the header information of currently selected files, use the edit header button
172
   - any opened measurement has an info display of its header at the bottom for easier navigation
173
 
174
d) Histogram window:
175
   - displays the currently selected histogram in the histogram file selection window
176
 
177
e) Histogram controls window:
178
   - directly linked to the histogram window, it enables plotting options
179
   - can set ranges on histogram plots
180
   - can change between different histogram types (ADC, TDC, ADC vs. TDC, 2D surface plot)
181
   - for the 2D surface plot, the relevant files need to be selected in the histogram file selection window
182
   - toggle for logarithmic Y scale
183
   - the currently selected histogram can be manually exported with the export button
184
   - fit settings used when running "Fit spectrum" and "Fit all selected" options in the Analysis menu
185
 
186
On the top, there are 4 menus:
187
a) File:
188
   - New Measurement -> not working
189
   - Exit -> exit the software (shortkey x)
190
 
191
b) Analysis:
192
   - Histogram type -> change between histogram types (same as in histogram controls window)
193
   - Fit spectrum -> fit the currently open spectrum for peaks
194
   - Fit all selected -> fit all the selected ADC spectra selected in the histogram file selection window for peaks and display
195
   the breakdown voltage plots
196
   - Integrate spectrum (X, Y) -> integrate the ADC spectrum for multiple files with an X or Y scan (used for edge scans)
197
   - Relative PDE -> calculation of the relative PDE for the currently selected files
198
 
199
c) Tools:
200
   - Fieldpoint temperature sensor -> direct graphing of the fieldpoint temperature sensor (with settings for fieldpoint channel,
201
   start time and end time), output is a graph (if exporting) and a comma separated list saved to folder ./fieldpoint. Updating
202
   the graph can cause unstable behavior. If possible, use ~/sipmscan/fieldpoint_standalone instead.
203
 
204
d) Windows:
205
   - Specific window tiling
206
   - Switch between active windows
207
 
208
e) Help information
209
 
210
Important!
211
When using any analysis method (surface 2D plot, fitting, integration, ADC spectra display) only events inside the selected TDC
212
window will be used so set the TDC range accordingly.
213
 
214
===================================
215
= 4. Preparing for measurements ===
216
===================================
217
 
218
General information for preparing the experimental setup and software for measurements.
219
 
220
________________________
221
4a. Pre-software checks:
222
 
223
Before running the Online version of the program, make sure that CAMAC (Computer Automated Measurement And Control) is turned
224
on and is connected to the computer via a USB cable. If upon starting, the program gives the following message:
225
 
226
        daq::connect() - No devices were detected!
227
 
228
then CAMAC was not started or the program did not properly register it.
229
 
230
In addition, for the Online version of the program, make sure that all movement table controllers are turned on and are connected
231
to the computer via a USB cable.
232
 
233
For the connection with the oscilloscope (Online and Offline with scope control versions of the program), make sure it is
234
connected to the same network with a UTP cable and that the VXI software is started on it.
235
 
236
______________________________________________
237
4b. Experimental setup pre-measurement checks:
238
 
239
When making changes inside the setup, make sure that no cables are hindering the movement of any of the movement tables. For
240
the X, Y and Z axis table, the most critical are motor control cables (white, flat, multiwire cables) and the optical cable
241
for laser optics (yellow or orange optical fibre). For the rotation table, the most critical are voltage supply cable (marked
242
with BIAS) and signal cables (the same as bias cable, but unmarked or marked with SIGNAL).
243
 
244
Additionally, whenever putting the experimental setup back together, note the distance between the laser optics and the sample.
245
The sample should be placed out of harms way from the collimator of the optics (check it by setting Z axis position to 0).
246
 
247
____________________________________
248
4c. Software pre-measurement checks:
249
 
250
Before starting any measurement, it is suggested to set the Voltage limit (Settings pane, Measurement tab) in order to avoid
251
any unwanted mistakes in bias voltage settings (to avoid any irreparable damage to the sample). Also, make sure to note the
252
output channel for bias voltage supply and not change any other channels (since they could be connected to other experimental
253
setups).
254
 
255
=====================
256
= 5. Measurements ===
257
=====================
258
 
259
Information on the settings for performing measurements available in this program and information on the movement tables.
260
 
261
_________________________
262
5a. Measurement settings:
263
 
264
On the Settings pane in the Measurement tab, the type of measurement can be selected:
265
- None is checked: The program will perform a single measurement (useful for quickly determining the state of the setup).
266
- Voltage scan is checked: The program will enable V(min), V(max) and V(step) settings and perform multiple measurements at
267
different bias voltages. The number of measurements is equal to:
268
 
269
        Floor( [V(max) - V(min)]/V(step) )
270
 
271
  The last measurement is at a voltage always lower or equal to V(max) for safety reasons. Whenever V(step) is 0, only one
272
measurement will be performed at V(min).
273
 
274
- Surface scan is checked: The program will enable X(min), X(max) and X(step), and Y(min), Y(max) and Y(step) settings and
275
perform multiple measurements at different table positions (surface scan). The number of measurements is equal to:
276
 
277
        Floor( [X(max) - X(min)]/X(step) )          Floor( [Y(max) - Y(min)]/Y(step) )
278
 
279
  The last measurement is at a position always smaller or equal to X(max) or Y(max). Whenever X(step) is 0, only one measurement
280
will be performed at X(min) and equally in the Y axis direction. By setting one axis step size to 0, only scans along one axis
281
are performed (for example for edge scans).
282
 
283
- Z-axis scan is checked: The program will enable Z(min), Z(max) and Z(step) settings and perform multiple measurements at
284
different distances between laser optics and the sample (Z axis). The number of measurements is equal to:
285
 
286
        Floor( [Z(max) - Z(min)]/Z(step) )
287
 
288
  The last measurement is at a position always smaller or equal to Z(max). Whenever Z(step) is 0, only one measurement will be
289
performed at Z(min).
290
 
291
- Rotation scan is checked: The program will enable Angle(min), Angle(max) and Angle(step) settings and perform multiple
292
measurements at different incidence angles (angle away from perpendicular incidence of laser light on the sample). The number
293
of measurements is equal to:
294
 
295
        Floor( [Angle(max) - Angle(min)]/Angle(step) )
296
 
297
  The last measurement is at an angle always smaller or equal to Angle(max). Whenever Angle(step) is 0, only one measurement
298
will be performed at Angle(min).
299
 
300
Surface scan and Z axis scan can be combined to perform edge scans at different distances between optics and sample (useful
301
for finding the focal point of the laser).
302
 
303
_______________________________________
304
5b. Temperature chamber considerations:
305
 
306
Whenever using the temperature chamber, be careful about the set temperature. SiPM samples have a specific operational and
307
storage temperatures that should not be exceeded. The temperature chamber, however, has slight overshoots when increasing
308
the temperature, thus heating slightly above the set temperature (sometimes as much as 5 degrees) and then cooling back down.
309
 
310
The chamber also has some problems cooling after previous heating (ex. coming from 0 degrees to 25 degrees and then again
311
cooling the chamber). In this case, it will seem to remain around some temperature, although it is supposed to be cooling
312
down. Sometimes this can be solved by turning off the chamber and waiting for some time or by making a large temperature
313
jump from higher to lower temperature (taking into consideration the sample temperature range).
314
 
315
Opening the chamber after measurements at low temperatures should be very short, since condensation forms very quickly that
316
can then lead to the water droplets freezing at low temperatures. Ideally, the chamber should be warmed close to room
317
temperature before opening, but any very short changes to the setup can still be performed when at lower temperatures.
318
 
319
___________________
320
5c. Movement table:
321
 
322
The movement tables are controlled by National Aperture MicroMini controllers through a subprogram found in
323
$sipmscan/trunk/src/MIKRO. Sometimes special measures are needed (in case of problems) that are not available inside the
324
sipmscan software, but can be achieved by going directly to the subprogram. The subprogram can be run, by going directly
325
to its directory and running:
326
 
327
        ./mikro_ctrl [arguments]
328
 
329
The arguments can be (only running ./mikro_ctrl will bring up help information):
330
- Node select: -n [node nr]. The [nodenr] is the address number of the controller as set on the front of the MicroMini
331
controller.
332
- Initialize node: -i [init type]. The [inittype] is the initialization type that can be 3M Linear (1), 3M Rotational (2),
333
4M Linear (3) or 4M Rotational (4). 3M are the smaller/shorter versions, while 4M are the larger/longer versions (all three
334
axis are 4M Linear and the angle is 3M Rotational). Always needs the node select argument (-n).
335
- Node homing: -h. Sets the node to a predetermined 0 value (home). Always needs the node select argument (-n). IMPORTANT: The
336
rotational table must never be set to home! It does not have a predetemined zero, so the table will infinitely spin and can
337
cause harm to the sample or attached cables.
338
- Reset node: -r. Does a complete reset of the controller. Always needs the node select argument (-n). After reset, the
339
controller needs to be initialized in order to work properly.
340
- Node status: -a. Returns the current status of the controller. Can be used with node select argument (-n) to target specific
341
controller or without to display status from all.
342
- Node position: -p. Returns the current position of the controller. Always needs the node select argument (-n).
343
- Node get command: -g [command]. Get return value from the issued command. Always needs the node select argument (-n). For
344
possible commands, see the MicroMini user manual.
345
- Node set command: -v [value] -s [command]. Set a value with an issued command. Always needs the node select argument (-n).
346
For possible commands and values, see the MicroMini user manual.
347
- Custom node command: -c [command]. Run one of the node commands without setting a value. Always needs the node select
348
argument (-n). For possible commands and values, see the MicroMini user manual.
349
 
350
Example commands:
351
- Reset node 1:
352
     ./mikro_ctrl -n 1 -r
353
- Initialize node 2 as a 4M Linear type:
354
     ./mikro_ctrl -n 2 -i 3
355
- Home node 3:
356
     ./mikro_ctrl -n 3 -h
357
- Determine node 1 position:
358
     ./mikro_ctrl -n 1 -p
359
- Prepare to move node 2 to an absolute position of 1000 and move it:
360
     ./mikro_ctrl -n 2 -v 500 -s la
361
     ./mikro_ctrl -c m
362
- Prepare to move node 3 relative to current position for -500 and move it:
363
     ./mikro_ctrl -n 2 -v -500 -s lr
364
     ./mikro_ctrl -c m
365
- Abort the current movement of node 4:
366
     ./mikro_ctrl -n 4 -c ab
367
 
368
Documentation:
369
- MicroMini controller manual: http://www-f9.ijs.si/~rok/detectors/oprema/national_aperture_stages/MicroMini_Manual.pdf
370
- 4M Linear table: http://www.naimotion.com/mm4mex.htm
371
- 3M Rotational table: http://www.naimotion.com/mm3mr.htm
372
 
373
________________________
374
5d. Bias voltage supply:
375
 
376
The bias voltage is supplied by the MPOD HV & LV power supply system through a subscript found in $sipmscan/trunk/src/mpod
377
(using the snmp software). Sometimes special measures are needed (in case of problems) that are not available inside the
378
sipmscan software, but can be achieved by going directly to the subprogram. The subprogram can be run, by going directly to
379
its directory and running:
380
 
381
        ./mpod_voltage.sh [arguments]
382
 
383
The arguments can be:
384
- Reset all output channels: --resetall
385
- Reset a selected output channel: -r [channel]
386
- Selects an output channel: -o [channel]
387
- Sets the output channel voltage: -v [voltage]
388
- Turns the output on/off: -s [0/1]
389
- Get the current output channel voltage: -g
390
 
391
Example commands:
392
- Get the set bias voltage on channel 1 (U0):
393
     ./mpod_voltage.sh -o 1 -g
394
- Turn the bias voltage off on channel 2 (U1):
395
     ./mpod_voltage.sh -o 2 -s 0
396
- Turn the bias voltage on and set it to 24.5V on channel 1 (U0):
397
     ./mpod_voltage.sh -o 1 -v 24.5 -s 1
398
- Reset channel 2 (U1):
399
     ./mpod_voltage.sh -o 2 -r
400
 
401
In its complete state, the command used in the script mpod_voltage.sh for setting for example an output voltage of 24.5 to
402
channel 1 (U0):
403
     snmpset -v 2c -M +. -m +WIENER-CRATE-MIB -c guru [IP address] outputVoltage.1 F 24.5 
404
 
405
Documentation:
406
- Net-SNMP: http://www.net-snmp.org/docs/man/
407
- MPOD: http://file.wiener-d.com/documentation/MPOD/Manual_MPOD_LV-HV_2.9.pdf
408
 
409
==========================
410
= 6. Measurement files ===
411
==========================
412
 
413
The measurement files, used for saving results, are constructed in native ROOT format to increase the read/write speeds while
414
reading and saving data.
415
________________________
416
6a. ROOT file structure:
417
 
418
The output ROOT files are structured in this way:
419
 
420
        ROOT file (TFile)
421
         |
422
         |== header_data (TTree): Header information (same for all events)
423
         |    |
424
         |    |== nrch (TBranch): Number of channels (ADC + TDC channels)
425
         |    |== timestamp (TBranch): Unix timestamp for start of measurement
426
         |    |== biasvolt (TBranch): Measurement bias voltage
427
         |    |== xpos (TBranch): X axis position in table units
428
         |    |== ypos (TBranch): Y axis position in table units
429
         |    |== zpos (TBranch): Z axis position in table units
430
         |    |== temperature (TBranch): Chamber temperature
431
         |    |== angle (TBranch): Incidence angle of measurement
432
         |    |== laserinfo (TBranch): Additional info for measurement
433
         |
434
         |== meas_data (TTree): Measured values from ADC and TDC (all events)
435
         |    |
436
         |    |== ADC0 (TBranch): All events from ADC channel 0 saved in order
437
         |    |== TDC0 (TBranch): All events from TDC channel 0 saved in order
438
         |    |== ADC1 (TBranch): All events from ADC channel 1 saved in order
439
         |    |== TDC1 (TBranch): All events from TDC channel 1 saved in order
440
         |    |== ... (TBranch): Additional channels up to 8 (0-7) in total
441
         |
442
         |== scope_data (TTree, optional): Measured values from the oscilloscope
443
              |
444
              |== measdata (TBranch): Currently in development
445
 
446
 
447
The easiest way to get the data is to create structures:
448
 
449
        struct EventHeader {
450
          int nrch;
451
          int timestamp;
452
          double biasvolt;
453
          int xpos;
454
          int ypos;
455
          int zpos;
456
          double temperature;
457
          double angle;
458
          char laserinfo[256];
459
        } evtheader;
460
 
461
        struct EventData {
462
          int adcdata[8];
463
          int tdcdata[8];
464
        } evtdata;
465
 
466
        struct EventMeas {
467
          double measdata;
468
        } evtmeas;
469
 
470
 
471
Then opening the file:
472
 
473
        TFile* inputfile = TFile::Open("filename.root","READ");
474
 
475
Then getting separate information:
476
- for instance for reading the bias voltage from header:
477
 
478
        TTree* sometree;
479
        inputfile->GetObject("header_data", sometree);
480
        sometree->SetBranchAddress("biasvolt", &evtheader.biasvolt);
481
        sometree->GetEntry(0);
482
 
483
- for instance for reading all ADC and TDC events in a file from channel 1 (ADC0):
484
 
485
        TTree* sometree;
486
        inputfile->GetObject("meas_data", sometree);
487
        char selectedCh[256];
488
        for(int i = 0; i < sometree->GetEntries(); i++)
489
        {
490
          sprintf(selectedCh, "ADC%d", 0);
491
          sometree->SetBranchAddress(selectedCh, &evtdata.adcdata[i]);
492
          sometree->GetEntry(i);
493
 
494
          sprintf(selectedCh, "TDC%d", 0);
495
          sometree->SetBranchAddress(selectedCh, &evtdata.tdcdata[i]);
496
          sometree->GetEntry(i);
497
        }
498
 
499
______________________________
500
6b. Opening measurement files:
501
 
502
The sipmscan software has internal handling for saving and opening measurement files. To open these files for an analysis, use
503
the File selection button in the Histogram file selection window (Analysis tab). Once the file or files are opened, it is possible
504
to double click a file on the list to display its histogram. The histogram can then be manipulated by changing ADC or TDC ranges,
505
or changing the type of displayed histogram (ADC, TDC ADC versus TDC).
506
 
507
Each of the selected files has a display of its header below the file list in order to quickly determine at what conditions and
508
when this measurement was taken. If there are any problems with the header, modifications can be performed with the Edit header
509
button.
510
 
511
After that analysis on the measurements can be performed, based on the selected ranges for ADC and TDC (note that each measured
512
event has a ADC and TDC channel value saved to the file).
513
 
514
=================
515
= 7. Analysis ===
516
=================
517
 
518
The sipmscan software already includes a number of analysis options:
519
- Plotting ADC (Analog-to-Digital Converter) spectrum, TDC (Time-to-Digital Converter) spectrum and ADC versus TDC 2D plots.
520
- Fitting of ADC spectrum photon equivalent peaks.
521
- ADC spectrum integration: Single or along X or Y directions (for edge scans).
522
- Relative Photon Detection Efficiency: Efficiency of sample relative to incidence angle.
523
- Breakdown voltage: Determination of silicon detector breakdown voltage through ADC spectrum photon peak separation (gain).
524
- Surface scan: Production of a 2D plot by integrating the ADC spectrum in each laser position.
525
 
526
Still to come...
527
 
528
===================
529
= 8. Change log ===
530
===================
531
 
181 f9daq 532
2;12.2016 (Current Rev)
533
a) Mostly fixed the fitting procedure for relative PDE point estimation. The maximum peak fit error should now work correctly, when excluding points that are far away from the relative PDE curve.
534
 
535
5.10.2016 (Rev 174)
173 f9daq 536
a) Fixed a couple of bugs and layout positions.
537
b) Added settings files for measurement and analysis settings. With this, everytime a new measurement or a new analysis is
538
ran, the selected settings are saved to a file. This way, if the program crashes, the selected settings will be automatically
539
filled in.
540
 
541
30.9.2016 (Rev 172):
172 f9daq 542
a) Fixed the time estimation for surface and Z-axis scans (TimeEstimateNew).
543
b) Did the same as c) in the previous revision, but separately for opening histogram files and for selecting the measurement
544
output file.
545
c) Added an Emergency stop button to the movement of the table - just in case a wrong value is inserted and there is something
546
in the way.
547
d) Added a way to integrate the surface scan, when using the "Start and Edit" option. This can be useful for determining the
548
angular dependence of the light passing onto a complete camera pixel.
549
 
550
11.8.2016 (Rev 167):
167 f9daq 551
a) When using breakdown voltage or relative PDE analysis and with only one file selected, the analysis is stopped and the fit
552
is displayed on the graph. This makes it easier to setup fitting settings.
553
b) Added the possibility to export plots created through analysis ("Start and edit" option).
554
c) Everytime, when opening a histogram file, the following open and save dialog windows automatically open up in that directory.
555
This makes it easier to find the directory that was used last.
556
d) Added a dropdown list to the Analysis tab, so that it is possible to set position units for plots (table units or microns).
557
e) Normalization to a maximum of 1 now works for surface scans.
558
 
559
4.4.2016 (Rev 146):
146 f9daq 560
a) Complete restructure of the program, so that it now runs seperately, not through ROOT (libraries are constructed pre-run).
561
Program is now split into multiple tabs for easier use, three of which are Measurement, Analysis and Help.
562
b) Added support for relative PDE measurements with included sample rotation table.
563
c) Improvement of analysis part of the program (includes ADC spectrum integration, breakdown voltage characterization, surface
564
scans, relative PDE characterization,...).
565
d) Added tooltips for different parts of the program for quick reference. Use them by hovering over any text entries, number
566
entries, check boxes or buttons.
567
e) Connection to temperature data and oscilloscope currently under development.
568
f) Older version of program moved to https://f9pc00.ijs.si/svn/f9daq/lab/sipmscan/trunk_v0.9 and will no longer be in development.
569
 
570
17.7.2015 (Rev 129):
571
a) Fixed a problem with ADC peak fitting (peak fitting returning a segmentation fault).
572
b) Added support to edit file headers (in case, some were created at an older date and did not include some header information or
573
there was a mistake in writing them).
574
c) Temperature data can only be retrieved when connected to the IJS network (IP = 178.172.43.xxx) and is disabled otherwise.
575
d) The relative PDE measurement now takes the incidence angle value directly from input files.
576
e) Currently, data acquisition only works on 32bit computers.
577
f) Fixed issue with program not correctly writting multiple channels.
578
 
579
5.5.2015 (Rev 128):
580
a) Added a header display for opened files in the histogram file selection window. This enables a quicker view of the measurement
581
information.
582
b) Added an incidence angle input to be able to save sample rotation angle to headers of files.
583
c) Added support for the fieldpoint temperature sensor (FP RTD 122). Can now plot and export data from the sensor for a specific
584
channel and specific time range. For now, this option only works if the PC you are using this program on is connected to an
585
internet/ethernet connection at IJS.
586
d) Added a limited relative PDE analysis option. At this time, it takes the selected files and calculates the PDE, relative to
587
the first selected file. The first file should be measured at incidence angle 0, with others having an incidence angle shift of
588
+15 (1st file -> 0, 2nd file -> 15, 3rd file -> 30,...).
589
 
590
9.4.2015 (Rev 127):
591
a) Added communications panel for connecting to a Tektronix scope.
592
b) Added limited support for waveform analysis with a Tektronix scope. For now, it only works when linking it to CAMAC acquisition.
593
c) Added a manual chamber temperature entry field.
594
 
595
16.3.2015 (Rev 117):
596
a) First version of sipmscan.
597
b) Added support for CAMAC, bias voltage settings and table position settings.
598
c) Added support for opening measured histograms.
599
d) Added support for analysis:
600
   - making surface plots
601
   - fitting the ADC spectrum
602
   - creating breakdown voltage plots
603
   - integrating the ADC spectrum with changing X or Y direction (edge scans)